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SIGLENT: Home / Products
SDS5000L Low Profile Digital Storage Oscilloscope
Main Features
  • 350 MHz, 500 MHz, 1GHz models
  • 8 analog channels + 1 external trigger
  • Sampling rate up to 5 GSa/s
  • Waveform capture rate up to 650,000 wfm/s (Sequence mode)
  • Up to 2.5 Gpts/ch waveform length
  • SYNC-64 to Synchronize 64 x SDS5000L
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Power-Up Sequence Analysis
Modern electronic systems incorporate various chips and modules whose initialization and operation may interfere with each other. Power-up sequence testing ensures that signals from different circuit modules follow the correct timing to avoid conflicts and guarantee system stability. For example, improper power-up sequences in communication systems can lead to data transmission errors. As circuit complexity increases, so do the challenges of power-up testing. The SDS5000L captures the entire power-up process of all relevant signals in a single acquisition, reducing measurement time, improving efficiency, and minimizing errors caused by repeated tests. For complex circuits with 8 power rails, this capability enables one-shot measurements. 
Three-Phase Power Analysis
Using an 8-channel oscilloscope for three-phase power analysis allows simultaneous connection to all phases. It synchronously measures three-phase voltage and current signals, accurately capturing waveforms and parameters in real time. Users can directly observe and compare phase relationships to ensure balance. With the Fast Fourier Transform (FFT) function, multi-channel oscilloscopes perform harmonic analysis on three-phase signals. Optional three-phase analysis software supports vector diagram testing for motors, power quality assessment, ripple analysis, and efficiency evaluation. 
Complete Wide Bandgap Semiconductor Testing Solution
The launch of Siglent latest 8-channel oscilloscopes and optically isolated probes completes the final piece of the wide bandgap semiconductor testing puzzle. The SDS5000L achieves a rise time at the picosecond (ps) level, capturing fast-switching waveforms of silicon carbide (SiC) and gallium nitride (GaN) devices. It analyzes transient voltage and current changes during switching, as well as characteristics like overshoot and ringing, to optimize circuit design and signal integrity. 
Flexible Multi-channel High-speed Acquisition System with the SDS5000L
The SDS5000L features a compact form factor with a mere 1U height, enabling the construction of flexible multi-channel acquisition systems. Multiple units are combined to create a high-speed acquisition system with up to 512 channels by being triggered with low-skew synchronization signals from the 64-channel synchronization distributor SYN64 The host can access each unit over 1000M LAN. A complete SCPI command set as well as LabVIEW and IVI drivers are provided for easy data acquisition. The LAN port is LXI compliant. Sample clocks are synchronized between all units in the test system by cascading the 10 MHz In and 10 MHz Out clocks in a daisy chain. 
Model
Bandwidth
Channels
Sampling Rate
Waveform Update Rate
Memory Depth
SDS5038L
350 MHz
8 + EXT
5 GSa/s
650,000 wfm/s
2.5 Gpts
SDS5058L
500 MHz
8 + EXT
5 GSa/s
650,000 wfm/s
2.5 Gpts
SDS5108L
1 GHz
8 + EXT
5 GSa/s
650,000 wfm/s
2.5 Gpts
Tel:
006-04-3998964
Address:
NO.6 LORONG JELAWAT 4 KAWASAN PERUSAHAAN SEBERANG JAYA 13700, PERAI PULAU PINANG, Malaysia