SDS5000X HD Digital Storage Oscilloscope
Main Features
- 350 MHz, 500 MHz, 1 GHz models
- 4/6/8 analog channels + 1 external trigger
- 16 digital channels
- Sampling rate up to 5 GSa/s
- Up to 2.5 Gpts waveform length
- Waveform capture rate up to 650,000 wfm/s (Sequence mode)
- Typical ENOB at 1 GHz of 8.2 bits
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Power-Up Sequence Analysis
Modern electronic systems incorporate various chips and modules whose initialization and operation may interfere with each other. Power-up sequence testing ensures that signals from different circuit modules follow the correct timing to avoid conflicts and guarantee system stability. For example, improper power-up sequences in communication systems can lead to data transmission errors. As circuit complexity increases, so do the challenges of power-up testing. The SDS5000X HD captures the entire power-up process of all relevant signals in a single acquisition, reducing measurement time, improving efficiency, and minimizing errors caused by repeated tests. For complex circuits with 8 power rails, this capability enables one-shot measurements.
Three-Phase Power Analysis
Using an 8-channel oscilloscope for three-phase power analysis allows simultaneous connection to all phases. It synchronously measures three-phase voltage and current signals, accurately capturing waveforms and parameters in real time. Users can directly observe and compare phase relationships to ensure balance. With the Fast Fourier Transform (FFT) function, multi-channel oscilloscopes perform harmonic analysis on three-phase signals. Optional three-phase analysis software supports vector diagram testing for motors, power quality assessment, ripple analysis, and efficiency evaluation.
Complete Wide Bandgap Semiconductor Testing Solution
The launch of Siglent latest 8-channel oscilloscopes and optically isolated probes completes the final piece of the wide bandgap semiconductor testing puzzle. The SDS5000X HD achieves a rise time at the picosecond (ps) level, capturing fast-switching waveforms of silicon carbide (SiC) and gallium nitride (GaN) devices. It analyzes transient voltage and current changes during switching, as well as characteristics like overshoot and ringing, to optimize circuit design and signal integrity.
Model
Bandwidth
Channels
Sampling Rate
Waveform Update Rate
Memory Depth
SDS5034X HD
350 MHz
4 + EXT
5 GSa/s
650,000 wfm/s
2.5 Gpts
SDS5054X HD
500 MHz
4 + EXT
5 GSa/s
650,000 wfm/s
2.5 Gpts
SDS5104X HD
1 GHz
4 + EXT
5 GSa/s
650,000 wfm/s
2.5 Gpts
SDS5036X HD
350 MHz
6 + EXT
5 GSa/s
650,000 wfm/s
2.5 Gpts
SDS5056X HD
500 MHz
6 + EXT
5 GSa/s
650,000 wfm/s
2.5 Gpts
SDS5106X HD
1 GHz
6 + EXT
5 GSa/s
650,000 wfm/s
2.5 Gpts
SDS5038X HD
350 MHz
8 + EXT
5 GSa/s
650,000 wfm/s
2.5 Gpts
SDS5058X HD
500 MHz
8 + EXT
5 GSa/s
650,000 wfm/s
2.5 Gpts
SDS5108X HD
1 GHz
8 + EXT
5 GSa/s
650,000 wfm/s
2.5 Gpts
